November/December 2000 Feature Articles: Evanescent Microwave Microscope: A New Nondestructive Material Evaluation Tool with Very High Resolution (Part 1) - by M. Tabib-Azar Technical Tips: Film Processors - by John deLuca Announcing the NDT 2000 Association New Membership Benefits (being considered) Regulating Radiography; A Canadian Perspective - by D.W. Cochrane International News